Design built-in-self-test for ALU using scan cell approach /
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002
Main Authors: | , , |
---|---|
Format: | |
Language: | eng |
Published: |
2002
|
Subjects: |
_version_ | 1826410115734962176 |
---|---|
author | 441161 Muhammad Adam Menhat Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik |
author_facet | 441161 Muhammad Adam Menhat Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik |
author_sort | 441161 Muhammad Adam Menhat |
collection | OCEAN |
description | Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002 |
first_indexed | 2024-03-05T01:55:22Z |
format | |
id | KOHA-OAI-TEST:268631 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T01:55:22Z |
publishDate | 2002 |
record_format | dspace |
spelling | KOHA-OAI-TEST:2686312020-12-19T17:08:34ZDesign built-in-self-test for ALU using scan cell approach / 441161 Muhammad Adam Menhat Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik 2002engProject Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002Includes bibliographical referencesPRZSLField programmable gate arraysMicrocontrollers |
spellingShingle | Field programmable gate arrays Microcontrollers 441161 Muhammad Adam Menhat Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik Design built-in-self-test for ALU using scan cell approach / |
title | Design built-in-self-test for ALU using scan cell approach / |
title_full | Design built-in-self-test for ALU using scan cell approach / |
title_fullStr | Design built-in-self-test for ALU using scan cell approach / |
title_full_unstemmed | Design built-in-self-test for ALU using scan cell approach / |
title_short | Design built-in-self-test for ALU using scan cell approach / |
title_sort | design built in self test for alu using scan cell approach |
topic | Field programmable gate arrays Microcontrollers |
work_keys_str_mv | AT 441161muhammadadammenhat designbuiltinselftestforaluusingscancellapproach AT abukhariaainsupervisor designbuiltinselftestforaluusingscancellapproach AT fakultikejuruteraanelektrik designbuiltinselftestforaluusingscancellapproach |