Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA /
09
| Main Authors: | , , |
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| Format: | |
| Language: | eng |
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Washington : SPIE,
2008
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| Subjects: |
| _version_ | 1796700621790773248 |
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| author | Postek, Michael T. Allgair, John A. (John Alexander) Society of Photo-Optical Instrumentation Engineers |
| author_facet | Postek, Michael T. Allgair, John A. (John Alexander) Society of Photo-Optical Instrumentation Engineers |
| author_sort | Postek, Michael T. |
| collection | OCEAN |
| description | 09 |
| first_indexed | 2024-03-05T02:02:55Z |
| format | |
| id | KOHA-OAI-TEST:271159 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T02:02:55Z |
| publishDate | 2008 |
| publisher | Washington : SPIE, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:2711592020-12-19T17:08:41ZInstrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / Postek, Michael T. Allgair, John A. (John Alexander) Society of Photo-Optical Instrumentation Engineers Washington : SPIE,2008eng09PSZJBLNanostructured materialsMicrofabricationNanotechnologyURN:ISBN:9780819472625 (pbk.)URN:ISBN:081947262X (pbk.) |
| spellingShingle | Nanostructured materials Microfabrication Nanotechnology Postek, Michael T. Allgair, John A. (John Alexander) Society of Photo-Optical Instrumentation Engineers Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title | Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title_full | Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title_fullStr | Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title_full_unstemmed | Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title_short | Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA / |
| title_sort | instrumentation metrology and standards for nanomanufacturing ii 10 august 2008 san diego california usa |
| topic | Nanostructured materials Microfabrication Nanotechnology |
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