Modeling and extraction of interconnect parameters in very-large-scale integrated circuits / [mikrofilem]

Modeling and extraction of interconnect parameters in very-large-scale integrated circuits / [mikrofilem]

Thesis (PhD) - University of Illinois at Urbana-Champaign, 1983

Bibliographic Details
Main Author: 401137 Yuan, Chen-Ping
Format:
Subjects:
Integrated circuits

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