Built-In-Self-Test (BIST) pattern generation for circuit under test /

Ижил төстэй зүйлс

• BIST test pattern generator based on partitioning circuit inputs
  -н: Sánchez, Clara
  Хэвлэсэн: (2007)
• Modified pattern generator of built-in self test for sequential circuits with reduced test time /
  -н: Muhamad Ridzuan Radin Muhamad Amin, 1985-, зэрэг
  Хэвлэсэн: (2011)
• Modified pattern generator of built-in self test for sequential circuits with reduced test time [electronic resource]/
  -н: Muhamad Ridzuan Radin Muhamad Amin, 1985-
  Хэвлэсэн: (2011)
• Rekabentuk litar pengujian bagi litar berjujukan menggunakan teknik Built-in Self-Test (BIST) /
  -н: 452613 Zamri Jamein
  Хэвлэсэн: (2003)
• Deterministic Automatic Test Pattern Generation for Built-In Self Test System
  -н: Mohammed Khalid, Muhammad Nazir
  Хэвлэсэн: (2006)