Thin film analysis by x-ray scattering /

Thin film analysis by x-ray scattering /

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Bibliographic Details
Main Authors: 195147 Birkholz, Mario, Fewster, Paul F, Genzel, Christoph
Format:
Language:eng
Published: Weiheim : Wiley-VCH Verlag GmbH & Co. KGaA, 2006
Subjects:
Thin films
X-rays

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