Thin film analysis by x-ray scattering /

Thin film analysis by x-ray scattering /

40

Bibliographic Details
Main Authors:	195147 Birkholz, Mario, Fewster, Paul F, Genzel, Christoph
Format:
Language:	eng
Published:	Weiheim : Wiley-VCH Verlag GmbH & Co. KGaA, 2006
Subjects:	Thin films X-rays

Similar Items

X‐Ray Nanoanalysis Revealing the Role of Electronically Active Passivation Layers in Perovskite X‐Ray film Detectors
by: Matteo Verdi, et al.
Published: (2023-09-01)

Capability of X-ray diffraction for the study of microstructure of metastable thin films
by: David Rafaja, et al.
Published: (2014-11-01)

Penyediaan saput tipis kuprum indium disulfida dan analisis pembelauan sinsr-x nya /
by: 335474 Norizan Ghazali
Published: (1994)

Kajian analisis pembelauan sinar-X dan kesan perubahan suhu terhadap kekonduksian elektrik saput tipis CuInS2 /
by: Yussof Wahab, et al.

Portable X-ray Fluorescence Analysis of Water: Thin Film and Water Thickness Considerations
by: Julia Kagiliery, et al.
Published: (2021-08-01)

Study by X-ray diffraction of the residual stress produced during deposition of TiN thin films on metallic substrates
by: Mónica Monsalve, et al.
Published: (2010-01-01)

Research Paper: X-ray Photoelectron Spectroscopy of TiO2 Optical Thin Films at Managed Annealing Process
by: Alireza Bananej, et al.
Published: (2021-09-01)

Preparation and characterization of iron sulphide thin films by chemical bath deposition method
by: Kassim, Anuar, et al.
Published: (2010)

Pair distribution functions of amorphous organic thin films from synchrotron X-ray scattering in transmission mode
by: Chenyang Shi, et al.
Published: (2017-09-01)

Investigation of Nanostructures with X-ray Scattering Techniques
by: Dominik Kriegner, et al.
Published: (2019-09-01)

Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu6PS5I-based thin films deposited using magnetron sputtering
by: I.P. Studenyak, et al.
Published: (2017-07-01)

Determination of Bromine in Brine by Wavelength Dispersive X-ray Fluorescence Spectrometry with Film Adsorption Pretreatment
by: CHEN Jing-wei, et al.
Published: (2015-09-01)

Probing Functional Thin Films with Grazing Incidence X-Ray Scattering: The Power of Indexing
by: Detlef-M. Smilgies
Published: (2025-01-01)

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films
by: Oumezzine M., et al.
Published: (2012-06-01)

X-ray Absorption Spectroscopy Study of Thickness Effects on the Structural and Magnetic Properties of Pr<sub>2−δ</sub>Ni<sub>1−x</sub>Mn<sub>1+x</sub>O<sub>6−y</sub> Double Perovskite Thin Films
by: Mónica Bernal-Salamanca, et al.
Published: (2022-12-01)

Pixellated Perovskite Photodiode on IGZO Thin Film Transistor Backplane for Low Dose Indirect X-Ray Detection
by: Taoyu Zou, et al.
Published: (2021-01-01)

Insight into heterogeneous dynamics of growing islands using coherent x-ray scattering
by: I Dax, et al.
Published: (2023-01-01)

Deposition and characterization of Cu<sub>4</sub>SnS<sub>4</sub> thin films by chemical bath deposition method
by: Anuar Kassim, et al.
Published: (2010-06-01)

X-ray scattering from semiconductors /
by: 204746 Fewster, Paul F.
Published: (c200)

Structural characterization of PbTi03, Sm0.6Nd0.4NiO3 and NdMnO3 multifunctional Perovskite thin films
by: Rapenne L., et al.
Published: (2012-06-01)

Effect of indium content on X- ray diffraction and optical constants of InxSe1-x thin films
by: Bushra A. Hasan
Published: (2019-02-01)

Influence of deposition time on the properties of chemical bath deposited manganese sulfide thin films
by: Anuar Kassim, et al.
Published: (2010-12-01)

Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films
by: Samantha T. Jaszewski, et al.
Published: (2024-11-01)

Phase Formation Process in CdSe Thin Films
by: L.N. Ibrahimova, et al.
Published: (2024-03-01)

LiF Nanoparticles Enhance Targeted Degradation of Organic Material under Low Dose X-ray Irradiation
by: Felix Maye, et al.
Published: (2021-05-01)

Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials
by: Luca Pasquali, et al.
Published: (2021-01-01)

Characterization of nanostructured ZnO thin films deposited through vacuum evaporation
by: Jose Alberto Alvarado, et al.
Published: (2015-04-01)

A Study of Structure and Optical Properties of ZnO Thin Films Deposited by Using Thermal Evaporation Technique under Different Flow Rate of Oxygen O2
by: Samir A. Maki, et al.
Published: (2017-04-01)

X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grown and Annealed Titanium Nitride Thin Films
by: Monzer Maarouf, et al.
Published: (2021-02-01)

Impact of structure on mechanical properties and oxidation behavior of magnetron sputtered cubic and hexagonal MoNx thin films
by: Wolfgang Tillmann, et al.
Published: (2021-09-01)

Science and technology of thin films /
by: Matacotta, F. C., et al.
Published: (1995)

Measuring magnetic hysteresis curves with polarized soft X-ray resonant reflectivity
by: Raymond Fan, et al.
Published: (2024-05-01)

Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement
by: Junghwan Park, et al.
Published: (2021-04-01)

Structural and Mechanical Properties of Silica Mesoporous Films Synthesized Using Deep X-Rays: Implications in the Construction of Devices
by: Paula Y. Steinberg, et al.
Published: (2021-02-01)

Thin film processes /
by: Vossen, John L., et al.

Optical and Structural Properties of Natural MnSeO4 Mineral Thin Film
by: Ishak Afşin Kariper
Published: (2017-03-01)

Ultra-thin gold films on transparent polymers
by: Leosson Kristjan, et al.
Published: (2013-02-01)

Enhancement of the dynamic mechanical properties of chitosan thin films by crosslinking with greenly synthesized silver nanoparticles
by: Noha G. Madian, et al.
Published: (2020-11-01)

<b>Influence of complexing agent (Na<sub>2</sub>EDTA) on chemical bath deposited Cu<sub>4</sub>SnS<sub>4</sub> thin films</b>
by: Anuar Kassim, et al.
Published: (2010-08-01)

The Effect of Germanium Content(x) on the Electrical Properties of (Gex S1-x) Thin Films
by: Bushra A. Hasan
Published: (2010-11-01)