Validity of n-3 scaling law in dielectronic recombination processes /

Validity of n-3 scaling law in dielectronic recombination processes /

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Bibliographic Details
Main Authors: 222239 Wang, J. G., Kato, T., Murakami, I.
Format:
Published: Nagoya, Japan : NIFS, 1999
Subjects:
Ion recombination

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