Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
42
| Main Author: | |
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| Format: | |
| Language: | eng |
| Published: |
New York, NY : Springer,
2005
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| Subjects: |
42
| Main Author: | |
|---|---|
| Format: | |
| Language: | eng |
| Published: |
New York, NY : Springer,
2005
|
| Subjects: |