Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
42
| Main Author: | |
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| Format: | |
| Language: | eng |
| Published: |
New York, NY : Springer,
2005
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| Subjects: |
| _version_ | 1826362858098655232 |
|---|---|
| author | Egerton, Ray F |
| author_facet | Egerton, Ray F |
| author_sort | Egerton, Ray F |
| collection | OCEAN |
| description | 42 |
| first_indexed | 2024-03-04T14:26:10Z |
| format | |
| id | KOHA-OAI-TEST:39271 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-04T14:26:10Z |
| publishDate | 2005 |
| publisher | New York, NY : Springer, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:392712020-12-19T16:57:28ZPhysical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Egerton, Ray F New York, NY : Springer,2005eng4250PSZJBLElectron microscopyURN:ISBN:0387258000 (hbk.) |
| spellingShingle | Electron microscopy Egerton, Ray F Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title | Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title_full | Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title_fullStr | Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title_full_unstemmed | Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title_short | Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / |
| title_sort | physical principles of electron microscopy an introduction to tem sem and aem |
| topic | Electron microscopy |
| work_keys_str_mv | AT egertonrayf physicalprinciplesofelectronmicroscopyanintroductiontotemsemandaem |