Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Testing through microcomputers...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
Testing through microcomputers for educational exellence /
PSZJBL
Bibliographic Details
Main Author:
Yap, Kueh Chin
Format:
Subjects:
Educational tests and measurements
Holdings
Description
Similar Items
Staff View
Similar Items
Innovasi pengujian dan penilaian di sekolah /
by: Yap, Kueh Chin
Architectural awards of exellence 1975
by: 10597 American Institution of Steel Construction
Published: (1975)
Principles of educational and psychological testing /
by: 424722 Brown, Frederick Gramm
Published: (1976)
Computerized informative item banking /
by: 220704 Yap, Kueh Chin, et al.
Standardized tests in education/
by: 425712 Mehrens, William A., et al.
Published: (1975)