Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /

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Bibliographic Details
Main Authors:	Kalinin, S.V. (Sergei Vasil), Gruverman, A. (Alexei)
Format:
Language:	eng
Published:	New York, NY : Springer, 2007
Subjects:	Scanning probe microscopy Nanoelectronics
Online Access:	http://dx.doi.org/10.1007/978-0-387-28668-6

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