Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /
PSZJBL
| Үндсэн зохиолчид: | , |
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| Формат: | |
| Хэл сонгох: | eng |
| Хэвлэсэн: |
New York, NY : Springer,
2007
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| Нөхцлүүд: | |
| Онлайн хандалт: | http://dx.doi.org/10.1007/978-0-387-28668-6 |
| _version_ | 1826441995455823872 |
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| author | Kalinin, S.V. (Sergei Vasil) Gruverman, A. (Alexei) |
| author_facet | Kalinin, S.V. (Sergei Vasil) Gruverman, A. (Alexei) |
| author_sort | Kalinin, S.V. (Sergei Vasil) |
| collection | OCEAN |
| description | PSZJBL |
| first_indexed | 2024-03-05T09:52:34Z |
| format | |
| id | KOHA-OAI-TEST:427649 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T09:52:34Z |
| publishDate | 2007 |
| publisher | New York, NY : Springer, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4276492020-12-19T17:15:15ZScanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Kalinin, S.V. (Sergei Vasil) Gruverman, A. (Alexei) New York, NY : Springer,2007engPSZJBLScanning probe microscopyNanoelectronicshttp://dx.doi.org/10.1007/978-0-387-28668-6http://dx.doi.org/10.1007/978-0-387-28668-6URN:ISBN:9780387286679URN:ISBN:0387286675 |
| spellingShingle | Scanning probe microscopy Nanoelectronics Kalinin, S.V. (Sergei Vasil) Gruverman, A. (Alexei) Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title_full | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title_fullStr | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title_full_unstemmed | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title_short | Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / |
| title_sort | scanning probe microscopy electrical and electromechanical phenomena at the nanoscale |
| topic | Scanning probe microscopy Nanoelectronics |
| url | http://dx.doi.org/10.1007/978-0-387-28668-6 http://dx.doi.org/10.1007/978-0-387-28668-6 |
| work_keys_str_mv | AT kalininsvsergeivasil scanningprobemicroscopyelectricalandelectromechanicalphenomenaatthenanoscale AT gruvermanaalexei scanningprobemicroscopyelectricalandelectromechanicalphenomenaatthenanoscale |