Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /
PSZJBL
| Autors principals: | , |
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| Format: | |
| Idioma: | eng |
| Publicat: |
New York, NY : Springer,
2007
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| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.1007/978-0-387-28668-6 |