Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /
PSZJBL
Prif Awduron: | , |
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Fformat: | |
Iaith: | eng |
Cyhoeddwyd: |
New York, NY : Springer,
2007
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Pynciau: | |
Mynediad Ar-lein: | http://dx.doi.org/10.1007/978-0-387-28668-6 |