Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /
PSZJBL
| Main Authors: | , |
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| Formato: | |
| Idioma: | eng |
| Publicado: |
New York, NY : Springer,
2007
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| Subjects: | |
| Acceso en liña: | http://dx.doi.org/10.1007/978-0-387-28668-6 |