I.A.32 functional test (FT) pattern conversion to structural based functional test (SBFT) loadable pattern format /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2006

Bibliographic Details
Main Author: 450590 Ngan, Jeffery Choon Yip
Format:
Language:eng
Published: Skudai : Universiti Teknologi Malaysia, 2006
Subjects: