Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China /

Includes bibliographical references and index

Bibliographic Details
Main Authors: International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China), Wu, Yanwen
Format:
Language:eng
Published: Stafa-Zurich ; Enfield, N.H. : Trans-Tech Publications, c201
Subjects: