Modified pattern generator of built-in self test for sequential circuits with reduced test time [electronic resource]/

Modified pattern generator of built-in self test for sequential circuits with reduced test time [electronic resource]/

Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2011

Bibliographic Details
Main Author: Muhamad Ridzuan Radin Muhamad Amin, 1985-
Format:
Language:eng
Published: 2011
Subjects:
Integrated circuits

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