Design and test technology for dependable systems-on-chip /

Includes bibliographical references (p. 494-533) and index

Bibliographic Details
Main Authors: Ubar, Raimund, 1941-, Raik, Jaan, 1972-, Vierhaus, Heinrich Theodor, 1951-
Format:
Language:eng
Published: Hershey, PA : Information Science Reference, c201
Subjects: