Optical characterization of annealed silicon carbide (SIC) thin film deposited by RF magnetron sputtering technique /

Optical characterization of annealed silicon carbide (SIC) thin film deposited by RF magnetron sputtering technique /

Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2008

Bibliografiska uppgifter
Huvudupphovsmän: 512245 Kartiyani Muniandy, Bakar Ismail, supervisor, Fakulti Sains
Materialtyp:
Språk:eng
Publicerad: 2008
Beskrivning
Sammanfattning:Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2008

Liknande verk