Optical characterization of annealed silicon carbide (SIC) thin film deposited by RF magnetron sputtering technique /
Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2008
Príomhchruthaitheoirí: | 512245 Kartiyani Muniandy, Bakar Ismail, supervisor, Fakulti Sains |
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Formáid: | |
Teanga: | eng |
Foilsithe / Cruthaithe: |
2008
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Míreanna comhchosúla
Míreanna comhchosúla
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