Optical characterization of annealed silicon carbide (SIC) thin film deposited by RF magnetron sputtering technique /

Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2008

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Príomhchruthaitheoirí: 512245 Kartiyani Muniandy, Bakar Ismail, supervisor, Fakulti Sains
Formáid:
Teanga:eng
Foilsithe / Cruthaithe: 2008

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