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Structural characterization of...
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Structural characterization of silicon nanowires grown by a 150 MHz very high frequency plasma enhanced chemical vapor deposition /
Thesis (Doktor Falsafah (Fizik)) - Universiti Teknologi Malaysia, 2011
Bibliographic Details
Main Authors:
Habib Hamidinezhad, 1975-
,
Yussof Wahab, supervisor
,
Zulkafli Othaman, supervisor
,
Fakulti Sains
Format:
Language:
eng
Published:
2011
Subjects:
Silicon
Nanowires
Holdings
Description
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