Optical properties measurements of nanocrystalline silicon thin films [electronic resource] /

Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011

Bibliographic Details
Main Author:	Gan, Chee Hong, 1986-
Format:
Language:	eng
Published:	2011
Subjects:	Thin films Nanostructured materials

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