Modeling nanoscale imaging in electron microscopy /

Modeling nanoscale imaging in electron microscopy /

Includes bibliographical references and index.

Bibliographic Details
Main Authors: Vogt, Thomas, Dahmen, Wolfgang, 1949-, Binev, Peter
Format:
Language:eng
Published: New York, NY. : Springer, 2012
Subjects:
Scanning transmission electron microscopy Simulation methods
Image analysis

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