Face image quality inspection system according to ISO standard /

Face image quality inspection system according to ISO standard /

Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2012

Bibliographic Details
Main Authors: Ong, Paik Wen, 1982-, Syed Abdul Rahman, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Language:eng
Published: 2012
Subjects:
Human face recognition (Computer science)
Image processing

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