Functional test generation using micro operation fault model [electronic resource] /
Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2011
Bibliographic Details
| Main Author: |
Ong, Hui Yien, 1980- |
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| Format: | |
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| Language: | eng |
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| Published: |
2011
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| Subjects: | |
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