Advanced x-ray characterization techniques : selected peer reviewed papers from the international conference on X-ray and related technique in research and industry (ICXRI 2012), July 3-5, 2012, Pulau Pinang, Malaysia /

Includes bibliographical references and index

Bibliographic Details
Main Author: Zainal Arifin Ahmad
Format:
Language:eng
Published: Zurich-Durnten : Trans Tech Publications Ltd., 2013
Subjects: