Scanning electron microscope, optical microscope and visual inspection : a practical tool for correlating the features and caused of failure /

Scanning electron microscope, optical microscope and visual inspection : a practical tool for correlating the features and caused of failure /

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Bibliographic Details
Main Authors: 225354 Jamaliah Idris, Agus Suprapto, Asia-Pacific Electron Microscopy Conference (7th : 2000 : Singapore)
Format:
Subjects:
Scanning electron microscopes

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