Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th birthday /

Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th birthday /

Includes bibliographical references

Bibliographic Details
Main Authors: Nakamura, Syouji, editor, Qian, Cun Hua, editor, Chen, Mingchih, editor
Format:
Language:eng
Published: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., 2014
Subjects:
Nakamura, Syouji
Reliability (Engineering)

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