Testing for small-delay defects in nanoscale CMOS integrated circuits /

Includes bibliographical references (pages 215-222) and index

Detalhes bibliográficos
Main Authors: Goel, Sandeep K., Chakrabarty, Krishnendu
Formato:
Idioma:eng
Publicado em: Boca Raton : CRC Press, 2014
Assuntos: