ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /

Includes bibliographical references at the end of each chapters and index

Bibliographic Details
Main Authors: International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California), Electronic Device Failure Analysis Society, sponsor
Format:
Language:eng
Published: Materials Park, Ohio : ASM International, 2013
Subjects: