Electrical overstress (EOS) : devices, circuits, and systems /

"This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"--provided by publisher

Bibliographic Details
Main Author: Voldman, Steven H., author
Format:
Language:eng
Published: Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2014
Subjects: