Electrical overstress (EOS) : devices, circuits, and systems /
"This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"--provided by publisher
Main Author: | Voldman, Steven H., author |
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Format: | |
Language: | eng |
Published: |
Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc.,
2014
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Subjects: |
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