Atomic force microscopy in nanobiology /

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and forc...

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Bibliographic Details
Main Author: Takeyasu, Kunio, editor
Format:
Language:eng
Published: Boca Raton, Florida : CRC Press, 2014
Subjects: