Study on threshold voltage shifts and reliability in PFETs by high-voltage on-state and off-state stress [electronic resource] /

Thesis (Ph.D (Electrical Engineering and Information Systems)) - University of Tokyo, 2014

Bibliographic Details
Main Authors:	227744 Nurul Ezaila Alias, Toshiro Hiramoto, supervisor
Format:
Language:	eng
Published:	2013

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