Test vectors reduction for integrated circuit testing using horizontal hamming distance /

Test vectors reduction for integrated circuit testing using horizontal hamming distance /

Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016

Bibliographic Details
Main Authors: Arbab Alamgir, 1991-, author 604435, Abu Khari A'ain supervisor 639398, Fakulti Kejuruteraan Elektrik 540663
Format: text
Language:eng
Published: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2016
Subjects:
Integrated circuits

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