Test vectors reduction for integrated circuit testing using horizontal hamming distance /

Geahča maid

• Test vectors reduction for integrated circuit testing using horizontal hamming distance [electronic resource] /
  Dahkki: Arbab Alamgir, 1991-, author 604435
  Almmustuhtton: (2016)
• Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /
  Dahkki: Arbab Alamgir, 1991-, author 604435
  Almmustuhtton: (2022)
• Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /
  Dahkki: Arbab Alamgir, 1991-, author 604435, et al.
  Almmustuhtton: (2022)
• Modified pattern generator of built-in self test for sequential circuits with reduced test time /
  Dahkki: Muhamad Ridzuan Radin Muhamad Amin, 1985-, et al.
  Almmustuhtton: (2011)
• Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing
  Dahkki: Alamgir, Arbab
  Almmustuhtton: (2023)