Test vectors reduction for integrated circuit testing using horizontal hamming distance /
Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016
| Main Authors: | , , |
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| Format: | text |
| Language: | eng |
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Johor Bahru, Johor : Universiti Teknologi Malaysia,
2016
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| Subjects: |
| _version_ | 1826463192759402496 |
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| author | Arbab Alamgir, 1991-, author 604435 Abu Khari A'ain supervisor 639398 Fakulti Kejuruteraan Elektrik 540663 |
| author_facet | Arbab Alamgir, 1991-, author 604435 Abu Khari A'ain supervisor 639398 Fakulti Kejuruteraan Elektrik 540663 |
| author_sort | Arbab Alamgir, 1991-, author 604435 |
| collection | OCEAN |
| description | Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016 |
| first_indexed | 2024-03-05T15:01:51Z |
| format | text |
| id | KOHA-OAI-TEST:530301 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T15:01:51Z |
| publishDate | 2016 |
| publisher | Johor Bahru, Johor : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5303012022-04-24T01:16:31ZTest vectors reduction for integrated circuit testing using horizontal hamming distance / Arbab Alamgir, 1991-, author 604435 Abu Khari A'ain supervisor 639398 Fakulti Kejuruteraan Elektrik 540663 textJohor Bahru, Johor : Universiti Teknologi Malaysia,2016engThesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016Bibliography: p. 43-44.KK-FK-SKEFEELECTLIntegrated circuits |
| spellingShingle | Integrated circuits Arbab Alamgir, 1991-, author 604435 Abu Khari A'ain supervisor 639398 Fakulti Kejuruteraan Elektrik 540663 Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title | Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title_full | Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title_fullStr | Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title_full_unstemmed | Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title_short | Test vectors reduction for integrated circuit testing using horizontal hamming distance / |
| title_sort | test vectors reduction for integrated circuit testing using horizontal hamming distance |
| topic | Integrated circuits |
| work_keys_str_mv | AT arbabalamgir1991author604435 testvectorsreductionforintegratedcircuittestingusinghorizontalhammingdistance AT abukhariaainsupervisor639398 testvectorsreductionforintegratedcircuittestingusinghorizontalhammingdistance AT fakultikejuruteraanelektrik540663 testvectorsreductionforintegratedcircuittestingusinghorizontalhammingdistance |