Test vectors reduction for integrated circuit testing using horizontal hamming distance /

Test vectors reduction for integrated circuit testing using horizontal hamming distance /

Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016

Dades bibliogràfiques
Autors principals:	Arbab Alamgir, 1991-, author 604435, Abu Khari A'ain supervisor 639398, Fakulti Kejuruteraan Elektrik 540663
Format:	text
Idioma:	eng
Publicat:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2016
Matèries:	Integrated circuits

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