Test vectors reduction for integrated circuit testing using horizontal hamming distance [electronic resource] /
Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016
| Main Author: | |
|---|---|
| Format: | text |
| Language: | eng |
| Published: |
Johor Bahru, Johor : Universiti Teknologi Malaysia,
2016
|
| Subjects: |