Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/

Supervisor : Dr. Nurul Ezaila Alias

Bibliographic Details
Main Authors: Rahimah Hassan, 1992-, Nurul Ezaila Alias, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Language:eng
Published: Johor Bharu Universiti Teknologi Malaysia 2016
Subjects: