Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/
Supervisor : Dr. Nurul Ezaila Alias
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| Format: | |
| Language: | eng |
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Johor Bharu Universiti Teknologi Malaysia
2016
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| _version_ | 1796755843964731392 |
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| author | Rahimah Hassan, 1992- Nurul Ezaila Alias, supervisor Fakulti Kejuruteraan Elektrik |
| author_facet | Rahimah Hassan, 1992- Nurul Ezaila Alias, supervisor Fakulti Kejuruteraan Elektrik |
| author_sort | Rahimah Hassan, 1992- |
| collection | OCEAN |
| description | Supervisor : Dr. Nurul Ezaila Alias |
| first_indexed | 2024-03-05T15:08:09Z |
| format | |
| id | KOHA-OAI-TEST:532404 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T15:08:09Z |
| publishDate | 2016 |
| publisher | Johor Bharu Universiti Teknologi Malaysia |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5324042020-12-19T17:20:03ZRelliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ Rahimah Hassan, 1992- Nurul Ezaila Alias, supervisor Fakulti Kejuruteraan Elektrik Johor Bharu Universiti Teknologi Malaysia2016engSupervisor : Dr. Nurul Ezaila AliasaBibliography : p. 44-45FEELECTLMetal oxide semiconductor field-effect transistors |
| spellingShingle | Metal oxide semiconductor field-effect transistors Rahimah Hassan, 1992- Nurul Ezaila Alias, supervisor Fakulti Kejuruteraan Elektrik Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title | Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title_full | Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title_fullStr | Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title_full_unstemmed | Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title_short | Relliability behaviors of HCI and NBTI on 3-D planar mosfet and novel finfet/ |
| title_sort | relliability behaviors of hci and nbti on 3 d planar mosfet and novel finfet |
| topic | Metal oxide semiconductor field-effect transistors |
| work_keys_str_mv | AT rahimahhassan1992 relliabilitybehaviorsofhciandnbtion3dplanarmosfetandnovelfinfet AT nurulezailaaliassupervisor relliabilitybehaviorsofhciandnbtion3dplanarmosfetandnovelfinfet AT fakultikejuruteraanelektrik relliabilitybehaviorsofhciandnbtion3dplanarmosfetandnovelfinfet |