Development of an auto variable temperature testing system for Intel microprocessor /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Mekatronik)) - Universiti Teknologi Malaysia, 2006

Bibliographic Details
Main Author: 343957 Wong, Weng Wai
Format:
Language:eng
Published: Skudai : Universiti Teknologi Malaysia, 2006
Subjects: