ATOMIC-FORCE MICROSCOPY AND ITS APPLICATIONS /

ATOMIC-FORCE MICROSCOPY AND ITS APPLICATIONS /

Includes bibliographical references

Bibliographic Details
Main Authors: editor, Staszuk, Marcin, editor, Ziebowicz, Boguslaw, editor
Format:
Language:eng
Published: London, UK : IntechOpen, 2019
Subjects:
Atomic force microscopy

Similar Items