Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /
Main Authors: | , , , |
---|---|
Format: | text |
Language: | eng |
Published: |
Johor Bahru, Johor : Universiti Teknologi Malaysia,
2022
|
Subjects: | |
Online Access: | http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:149118 |