Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /

Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /

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Bibliographic Details
Main Authors:	Arbab Alamgir, 1991-, author 604435, Norlina Paraman, supervisor 441380, Usman Ullah Sheikh, 1981-, supervisor 483842, Fakulti Kejuruteraan. Sekolah Kejuruteraan Elektrik 619066
Format:	text
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2022

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