ELECTROENCEPHALOGRAM STRESS LEVEL CLASSIFICATION USING K-MEANS CLUSTERING AND SUPPORT VECTOR MACHINE /

ELECTROENCEPHALOGRAM STRESS LEVEL CLASSIFICATION USING K-MEANS CLUSTERING AND SUPPORT VECTOR MACHINE /

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Bibliographic Details
Main Authors: Tee Yi Wen, author 654463, Siti Armiza Mohd. Aris, supervisor 237498, Fakulti Teknologi dan Informatik Razak 619091
Format: text
Language:eng
Published: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2021
Subjects:
Electroencephalography
Machine learning

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