Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces /

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces /

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Bibliographic Details
Main Author: 409765 Kaupp, G.
Format:
Language:eng
Published: Berlin : Springer-Verlag, 2006
Subjects:
Atomic force microscopy
Near-field microscopy

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