Digital systems testing and testable design /

Digital systems testing and testable design /

16

Bibliographic Details
Main Authors: 190964 Abramovici, Miron, Breuer, Melvin A, Friedman, Arthur D.
Format:
Language:eng
Published: New York, NY : Wiley-IEEE Press/Wiley Interscience, 1990
Subjects:
Digital integrated circuits

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