Digital systems testing and testable design /
16
| Main Authors: | , , |
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| Format: | |
| Language: | eng |
| Published: |
New York, NY : Wiley-IEEE Press/Wiley Interscience,
1990
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| Subjects: |
| _version_ | 1796659736627642368 |
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| author | 190964 Abramovici, Miron Breuer, Melvin A Friedman, Arthur D. |
| author_facet | 190964 Abramovici, Miron Breuer, Melvin A Friedman, Arthur D. |
| author_sort | 190964 Abramovici, Miron |
| collection | OCEAN |
| description | 16 |
| first_indexed | 2024-03-04T16:07:38Z |
| format | |
| id | KOHA-OAI-TEST:72952 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-04T16:07:38Z |
| publishDate | 1990 |
| publisher | New York, NY : Wiley-IEEE Press/Wiley Interscience, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:729522020-12-19T17:00:08ZDigital systems testing and testable design / 190964 Abramovici, Miron Breuer, Melvin A Friedman, Arthur D. New York, NY : Wiley-IEEE Press/Wiley Interscience,1990eng16PSZJBLDigital integrated circuitsDigital integrated circuitsURN:ISBN:0780310624 (hbk.) |
| spellingShingle | Digital integrated circuits Digital integrated circuits 190964 Abramovici, Miron Breuer, Melvin A Friedman, Arthur D. Digital systems testing and testable design / |
| title | Digital systems testing and testable design / |
| title_full | Digital systems testing and testable design / |
| title_fullStr | Digital systems testing and testable design / |
| title_full_unstemmed | Digital systems testing and testable design / |
| title_short | Digital systems testing and testable design / |
| title_sort | digital systems testing and testable design |
| topic | Digital integrated circuits Digital integrated circuits |
| work_keys_str_mv | AT 190964abramovicimiron digitalsystemstestingandtestabledesign AT breuermelvina digitalsystemstestingandtestabledesign AT friedmanarthurd digitalsystemstestingandtestabledesign |